SKU:18770783491
In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LD
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- USA
- CAN
Ships within 48 hours · Estimated delivery Jul 12 - Jul 17
Description
In-Situ Thin Film Thickness / Deposition Rate Monitor with Software, and Optional Sensor, Quartz Crystals - TM106-LDEQ TM106 LD is a high precision thickness sensor monitor for the thin film deposition process. It is based on the principle that the mass of a deposited film on a quartz crystal can be measured by monitoring the change in crystals oscillating frequency. If the density of deposited material is known, the thickness can be determined to a high resolution of sub Angstrom (0. 037 for this equipment). SPECIFICATIONS: Power 5 VDC, 400 mA Frequency Range 6. 0
How to make a water-based electrode (graphite for the anode) for your reference:
18 NCM523 + Graphite 3
Single phase
Surface finish (RMS or Ra) : One side polished < 30A
ID: 108 mm
Orientation: (100)
Application Notes Replace tube for MTI tube furnaces Operating from 1600oC to 1750oC
MSK-510 Crimper
mso-tstyle-rowband-size:0
Related Products:
Depth is 8
Mobility: 4360-5640cm^2/V
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